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Wednesday, 18 May 2016

Symposium: Advanced Microscopy Techniques

May 18, 2016

1:00 PM - 5:00 PM

301A Spedding Hall

free

U.S. Department of Energy's Ames Laboratory Conferences

Learn about the most recent developments in the field of electron microscopy during a series of presentations on advanced focused ion beam (FIB) and scanning/transmission electron (S/TEM) techniques. Registration is free. Sponsored by the USDOE Ames Laboratory's Sensitive Instruments Facility.